Caner Tol

selected publications

1. Jolt - Recovering TLS Signing Keys via Rowhammer Faults

   Koksal Mus, Yarkın Doröz, M. Caner Tol, Kristi Rahman, and Berk Sunar

   2022

   Bib

   @article{mus2022jolt,
     title = {Jolt - Recovering TLS Signing Keys via Rowhammer Faults},
     author = {Mus, Koksal and Doröz, Yarkın and Tol, M. Caner and Rahman, Kristi and Sunar, Berk},
     year = {2022}
   }

2. Undermining User Privacy on Mobile Devices Using AI

   Berk Gulmezoglu, Andreas Zankl, M. Caner Tol, Saad Islam, Thomas Eisenbarth, and Berk Sunar

   In Proceedings of the 2019 ACM Asia Conference on Computer and Communications Security 2019

   Bib

   @inproceedings{gulmezoglu2019undermining,
     title = {Undermining User Privacy on Mobile Devices Using AI},
     author = {Gulmezoglu, Berk and Zankl, Andreas and Tol, M. Caner and Islam, Saad and Eisenbarth, Thomas and Sunar, Berk},
     booktitle = {Proceedings of the 2019 ACM Asia Conference on Computer and Communications Security},
     pages = {214--227},
     year = {2019}
   }

3. Toward Realistic Backdoor Injection Attacks on DNNs using Rowhammer

   M. Caner Tol, Saad Islam, Berk Sunar, and Ziming Zhang

   In 2021

   Bib

   @inproceedings{tol2021toward,
     title = {Toward Realistic Backdoor Injection Attacks on DNNs using Rowhammer},
     author = {Tol, M. Caner and Islam, Saad and Sunar, Berk and Zhang, Ziming},
     year = {2021}
   }

4. FastSpec- Scalable Generation and Detection of Spectre Gadgets Using Neural Embeddings

   M. Caner Tol, Berk Gulmezoglu, Koray Yurtseven, and Berk Sunar

   In 2021 IEEE European Symposium on Security and Privacy (EuroS&P) 2021

   Bib

   @inproceedings{tol2021fastspec,
     title = {FastSpec- Scalable Generation and Detection of Spectre Gadgets Using Neural Embeddings},
     author = {Tol, M. Caner and Gulmezoglu, Berk and Yurtseven, Koray and Sunar, Berk},
     booktitle = {2021 IEEE European Symposium on Security and Privacy (EuroS\&P)},
     pages = {616--632},
     year = {2021},
     organization = {IEEE}
   }